E-Frame Series Test & Development Platform


Elma Electronic Inc.

Valerie Andrew
Strategic Marketing Architect
The Modular Test and Development platform solution is used in cPCI (3U and 6U) based Embedded computing applications. With a rugged modular aluminum construction, the versatile E-frame tower can support up to 19 slots at .8" or 15 slots at 1" pitch, depending on cabling options. There are front accessible test points and monitoring LEDs for +3.3V, +/-5V, +/-12V, +/- 24V, and +/- 48VDC. The E-frame features high performance cooling with 3 x 150 CFM fans under the card cage. The fans are speed controlled with fan fail indication. A system monitor with remote monitoring via Ethernet capability is optional.
The black coated powder coated finish of the E-frame enhances aesthetics and provides scratch-resistance. Other features include a Rear A/C PEM (Power Entry Module) with fuses, GND stud, front located ESD jacks. The unit also offers full RTM (rear transition module) support.

- Versions supporting 3U or 6U cards
- Architecture includes CompactPCI
- Front accessible test points and monitoring LEDs for +3.3V, +/-5V, +/- 12V, +/- 24V, and +/- 48VDC
- High performance cooling via 3 x 150 CFM fans
- Speed controlled fans with fan-fail indication
- Optional system monitor with remote monitoring
- Full RTM support and rear A/C power entry module
- Pluggable front and rear module fan trays
- Top handle for ease of portability
- Attractive powder-coated finish is scratch-resistant
CompactPCI® > (Compact PCI) Development Tools