522 Series Development / Test Station


Atrenne Computing Solutions

SIE Computing Solutions 522 Series Development / Test Station offers
the test and development community a feature enhanced design combining
functionality and flexibility with aesthetic detail. Designed with the development
engineer in mind, the 522 Series incorporates the flexibility of hybrid
architectures and 2 conventional
slots for legacy applications with unobstructed accessibility to cards under test for probe access with intelligent system monitoring capabilities.

Features and Benefits
" Aesthetic Aluminum Design
" Available in 3U and 6U formats
" LED Array for DC Voltages
"DC Voltage test jacks
" Open frame for easy card access
" High volume cooling fans
" Speed controlled fans
" Fan fail monitored
" Front mounted system reset switch
" Rear Transition Module configured
" System Monitoring Board with
LCD Display
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